Researchers at Cornell University have developed a powerful imaging technique that reveals atomic scale defects inside computer chips for the first time. Using an advanced electron microscopy method, ...
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Tiny thermometers offer on-chip temperature monitoring for processors
The semiconductor chips driving modern-day computer processors are covered in billions of individual transistors, each of which can overheat under stress, causing steep drops in performance. To ...
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Research findings and signs of computer chip industry demands were the top subjects at the 40th Annual Microelectronic Engineering Conference April 8 at RIT. With indications of growth and novel ...
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