With the wave of wireless devices proliferating in the world today, there is a corresponding need to perform analysis of RF circuitry. It’s an exciting time for consumers of wireless devices, but it’s ...
The 2006 International Test Conference is scheduled for the week of October 22 in Santa Clara, CA. For more on this year’s ITC, read our interview with program chair Anne Gattiker. Semiconductor test ...
Many of you are familiar with the circuits and components developed by Bob Dobkin, CTO of Linear Technology Corp, and the late Jim Williams, Staff Scientist at LTC, along with others from LTC. Their ...
Many noise sources can plague high-speed radio-frequency (RF) analog signal chains, making design considerations that much more challenging. Both megahertz and sub-terahertz sampling-rate converters ...
Abstract— Today’s on-chip Analog/Mixed-Signal and RF (A/RF) systems have reached a limit of size and complexity where transistor-level SPICE and FastSPICE simulation approaches cannot deliver a ...
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